• A self-checking scheme to mitigate single event upset effects in SRAM-based FPAAs 

      Balen, Tiago Roberto; Leite, Franco Ripoll; Kastensmidt, Fernanda Gusmão de Lima; Lubaszewski, Marcelo Soares (2009) [Artigo de periódico]
      In this work the problem of Single Event Upset (SEU) is considered in a recent analog technology: The Field Programmable Analog Arrays (FPAAs). Some FPAA models are based on SRAM memory cells to implement the user ...