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dc.contributor.authorAraújo, Leandro Langiept_BR
dc.contributor.authorGrande, Pedro Luispt_BR
dc.contributor.authorBehar, Monipt_BR
dc.contributor.authorDias, Johnny Ferrazpt_BR
dc.contributor.authorLifschitz, A.F.pt_BR
dc.contributor.authorArista, Nestorpt_BR
dc.contributor.authorSchiwietz, Gregorpt_BR
dc.date.accessioned2014-10-04T02:13:34Zpt_BR
dc.date.issued2004pt_BR
dc.identifier.issn1050-2947pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/104178pt_BR
dc.description.abstractIn this work we have measured the electronic energy loss of ⁹Be and ¹¹B ions for the ‹100› and ‹110› directions in Si as a function of the incident ion energy. The channeling measurements cover a wide energy range between 100 keV/amu and 1 MeV/amu. The Rutherford backscattering technique has been employed in the present experiments. An overall compilation of channeling energy loss values for several ions, including those for He, Li, and O measured previously, provides a clear picture of the Barkas contribution to the stopping power due to valence electrons in the present energy regime. A maximum of the relative contribution occurs for Be ions around 250 keV/amu while a saturation effect is observed for heavier ions. These results are interpreted in terms of a self-consistent nonlinear calculation based on the transport cross-section approach together with the unitary convolution approximation model, which describe the present data reasonably well at high projectile energies.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofPhysical review. A, Atomic, molecular, and optical physics. New York. Vol. 70, no. 3 (Sept. 2004), 032903, 8p.pt_BR
dc.rightsOpen Accessen
dc.subjectBeriliopt_BR
dc.subjectPerda de energia de particulaspt_BR
dc.subjectImpacto ion-superfíciept_BR
dc.subjectRetroespalhamento rutherfordpt_BR
dc.subjectSilíciopt_BR
dc.titleElectronic energy loss of channeled ions : the giant Barkas effectpt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000504071pt_BR
dc.type.originEstrangeiropt_BR


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