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Ferromagnetic resonance of fe(111)/cu(111)multilayers

dc.contributor.authorRezende, Sergio Machadopt_BR
dc.contributor.authorMoura, J.A.S.pt_BR
dc.contributor.authorAguiar, F.M. dept_BR
dc.contributor.authorSchreiner, Wido Herwigpt_BR
dc.date.accessioned2014-10-07T02:11:22Zpt_BR
dc.date.issued1994pt_BR
dc.identifier.issn0163-1829pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/104217pt_BR
dc.description.abstractFerromagnetic resonance at 9.4 GHz has been used to characterize several samples of Fe sing1e-crystal films and Fe/Cu multilayers prepared by electron-beam deposition on HF-etched, hydrogen-terminated Si(111). Resonance field data as a function of the field orientation in the film plane confirmed that Fe films and Fe/Cu multilayers grow epitaxially on Si(111) with excellent crystallinity in the [111] orientation. Moreover, we have found that the (111) plane is unique among the principal planes in cubic crystals, because it allows precise measurements of the small second-order and in-plane anisotropies as well as misorientations from the crystal plane.en
dc.format.mimetypeapplication/pdf
dc.language.isoengpt_BR
dc.relation.ispartofPhysical review. B, Condensed Matter. New York. Vol. 49, n. 21 (June 1994), p. 15105-15109pt_BR
dc.rightsOpen Accessen
dc.subjectFísica da matéria condensadapt_BR
dc.subjectRessonancia ferromagneticapt_BR
dc.subjectCristalinidadept_BR
dc.subjectFilmes finos magneticospt_BR
dc.subjectAnisotropia magnéticapt_BR
dc.subjectCrescimento epitaxialpt_BR
dc.subjectFeixes de eletronspt_BR
dc.titleFerromagnetic resonance of fe(111)/cu(111)multilayerspt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000220507pt_BR
dc.type.originEstrangeiropt_BR


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