Mostrar registro simples

dc.contributor.authorFadanelli Filho, Raul Carlospt_BR
dc.contributor.authorGrande, Pedro Luispt_BR
dc.contributor.authorBehar, Monipt_BR
dc.contributor.authorDias, Johnny Ferrazpt_BR
dc.contributor.authorSchiwietz, Gregorpt_BR
dc.contributor.authorDenton, Cristian D.pt_BR
dc.date.accessioned2014-10-08T02:11:17Zpt_BR
dc.date.issued2004pt_BR
dc.identifier.issn1098-0121pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/104265pt_BR
dc.description.abstractSi-K x-ray and backscattering yields have been measured as a function of the projectile entrance angle for atomic and molecular (H2 + and H3 +) hydrogen ions channeling at kinetic energies of 150 keV per proton along the Si k100l crystal direction. A large enhancement of the x-ray production has been observed for well-aligned H3 + molecule beams. It is shown that this effect results from the Coulomb explosion of the molecule fragments during the channeling motion. Moreover, the shape and intensity of the measured angular distribution allows a quantitative determination of the corresponding heating of the transversal ion motion (2.6±0.6 eV for H2 + and 5.1±0.8 eV for H3 + molecules) in the channel. These values are consistent with the stored potential energies per particle and they depend significantly on the collective wake forces and molecular alignment conditions.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofPhysical review. B, Condensedmatter and materials physics. Woodbury. Vol. 69, no. 21 (June 2004), 212104 4p.pt_BR
dc.rightsOpen Accessen
dc.subjectFísicapt_BR
dc.subjectCanalizaçãopt_BR
dc.subjectSemicondutores elementarespt_BR
dc.subjectRetroespalhamentopt_BR
dc.subjectSilíciopt_BR
dc.subjectIntensidade de linha espectralpt_BR
dc.subjectEspalhamento de raios-xpt_BR
dc.titleCoulomb heating of channeled H/sup + sub 2/ and H/sup + sub 3/ molecules in Sipt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000459219pt_BR
dc.type.originEstrangeiropt_BR


Thumbnail
   

Este item está licenciado na Creative Commons License

Mostrar registro simples