Mostrar registro simples

dc.contributor.authorMichels, Alexandre Fassinipt_BR
dc.contributor.authorMenegotto, Thiagopt_BR
dc.contributor.authorGrieneisen, Hans Peter Henrikpt_BR
dc.contributor.authorSusin, Maurício Paulo Balenpt_BR
dc.contributor.authorHorowitz, Flaviopt_BR
dc.date.accessioned2014-11-20T02:15:20Zpt_BR
dc.date.issued2006pt_BR
dc.identifier.issn1559-128Xpt_BR
dc.identifier.urihttp://hdl.handle.net/10183/107160pt_BR
dc.description.abstractA brief overview of optical monitoring for vacuum and wet-bench film-deposition processes is presented. Interferometric and polarimetric measurements are combined with regard to simultaneous monitoring of refractive index and physical thickness in real time. Monitoring stability and accuracy are verified during dip coating with a transparent oil standard. This double optical technique is applied to dip coating with a multicomponent zirconyl chloride aqueous solution, whose resulting temporal refractive-index and physical-thickness curves indicate good reproducibility as well as significant sensitivity to changes of film-flow properties during the dip-coating process.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofApplied optics (2004). Washington, DC. Vol. 45, no. 7 (Mar. 2006), p. 1491-1494pt_BR
dc.rightsOpen Accessen
dc.subjectInterferometria luminosapt_BR
dc.subjectFilmes oticospt_BR
dc.subjectIndice de refracaopt_BR
dc.subjectPolarimetriapt_BR
dc.subjectRevestimento depositado a vácuopt_BR
dc.titleDouble optical monitoring of dip coating with a time-varying refractive indexpt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000558912pt_BR
dc.type.originEstrangeiropt_BR


Thumbnail
   

Este item está licenciado na Creative Commons License

Mostrar registro simples