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dc.contributor.authorBoff, Marco Aurelio Silveirapt_BR
dc.contributor.authorTeixeira, Sergio Ribeiropt_BR
dc.contributor.authorSchmidt, Joao Edgarpt_BR
dc.contributor.authorAntunes, Arlei Borbapt_BR
dc.date.accessioned2016-05-19T02:09:56Zpt_BR
dc.date.issued2004pt_BR
dc.identifier.issn0003-6951pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/141338pt_BR
dc.description.abstractA systematic study of the electrical resistance as a function of the temperature was performed in Fe-Al2O3 granular thin films. Our findings revealed a nonlinear dependence of the current versus voltage in the low field regime at low temperature. The variable range hopping mechanism is the best description of the behavior of our samples. A change of the electronic properties can be observed depending on the direct current applied to the sample’s plane, and is related to different localization lengths.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofApplied physics letters. Vol. 85, no. 5 (Aug. 2004), p. 757-758pt_BR
dc.rightsOpen Accessen
dc.subjectResistividade elétricapt_BR
dc.subjectFilmes finospt_BR
dc.titleChange of the electrical properties in Fe-Al/sub 2/O/sub 3/ granular filmspt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000442976pt_BR
dc.type.originEstrangeiropt_BR


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