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dc.contributor.authorSantos, Alexandre Pereira dospt_BR
dc.contributor.authorNetz, Roland R.pt_BR
dc.date.accessioned2019-06-18T02:34:25Zpt_BR
dc.date.issued2018pt_BR
dc.identifier.issn0021-9606pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/195839pt_BR
dc.description.abstractUsing Monte Carlo simulations in conjunction with periodic Green’s function methods, we study the interaction between planar charged surfaces with point-like counterions only in the presence of dielectric boundaries. Based on the calculated pressure profiles, we derive phase diagrams featuring correlation-induced negative pressure and thus attraction between the plates for large coupling parameters, i.e., low temperature or high surface charge and high ion valency. The counterion density profiles for low-dielectric and high-dielectric (metallic) surfaces are very different from the idealized case of a homogeneous dielectric constant. By contrast, the phase diagrams including the critical point and the two-phase coexistence region are rather insensitive to the presence of dielectric boundary effects. The single-image approximation that has been used in simulations before is by comparison with the exact formalism shown to be very accurate for low-dielectric surfaces but not for metallic surfaces.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofThe journal of chemical physics. New York. Vol. 148, no. 16 (Apr. 2018), 164103, 6 p.pt_BR
dc.rightsOpen Accessen
dc.subjectDiagramas de fasept_BR
dc.subjectFuncoes de greenpt_BR
dc.subjectEletrostáticapt_BR
dc.subjectMétodo de Monte Carlopt_BR
dc.titleDielectric boundary effects on the interaction between planar charged surfaces with counterions onlypt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb001094484pt_BR
dc.type.originEstrangeiropt_BR


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