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dc.contributor.authorAbate, F.pt_BR
dc.contributor.authorSterpone, Lucapt_BR
dc.contributor.authorLisboa, Carlos Arthur Langpt_BR
dc.contributor.authorCarro, Luigipt_BR
dc.contributor.authorViolante, Massimopt_BR
dc.date.accessioned2011-01-29T06:00:45Zpt_BR
dc.date.issued2009pt_BR
dc.identifier.issn0018-9499pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/27627pt_BR
dc.description.abstractThe growing availability of embedded processors inside FPGAs provides unprecedented flexibility for system designers. The use of such devices for space or mission critical applications, however, is being delayed by the lack of effective low cost techniques to mitigate radiation induced errors. In this paper a non invasive approach for the implementation of fault tolerant systems based on COTS processors embedded in FPGAs, using lockstep in conjunction with checkpoint and rollback recovery, is presented. The proposed approach does not require modifications in the processor architecture or in the application software. The experimental validation of this approach through fault injection is described, the corresponding results are discussed, and the addition of a write history table as a means to reduce the performance overhead imposed by previous implementations is proposed and evaluated.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofIEEE transactions on nuclear science. New York. Vol. 56, no 4 (Aug. 2009), p. 1992-2000pt_BR
dc.rightsOpen Accessen
dc.subjectEmbedded processors reliabilityen
dc.subjectMicroeletrônicapt_BR
dc.subjectSingle event effectsen
dc.subjectSistemas embarcadospt_BR
dc.subjectLockstepen
dc.subjectCheckpointen
dc.subjectRollback recoveryen
dc.subjectFault injectionen
dc.titleNew techniques for improving the performance of the lockstep architecture for SEEs mitigation in FPGA embedded processorspt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000719345pt_BR
dc.type.originEstrangeiropt_BR


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