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Direct etching of SiO2 and Al2O3 by 900-keV gold ions

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Direct etching of SiO2 and Al2O3 by 900-keV gold ions

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Título Direct etching of SiO2 and Al2O3 by 900-keV gold ions
Autor Glass, Gary A.
Dias, Johnny Ferraz
Dymnikov, Alexander D.
Houston, Louis M.
Rout, Bibhudutta
Abstract We report the direct etching of Al2O3 and SiO2 using 900-keV Au+ ions. 2000-mesh Cu grids were employed as masks using two different configurations: 1 the Cu mesh was placed on top of each insulator separately and independent irradiations were performed, and 2 the Al2O3 and SiO2 substrates were positioned in an edge-to-edge configuration with a single Cu grid providing a common mask to both insulators. Scanning electron microscopy SEM analysis revealed quite different patterns resulting from the two irradiation configurations. While the irradiation using individual masks resulted in mirror-image patterns of the Cu mask in the substrates, the use of a common mask led to single line structures approximately normal to the edges of the substrates. The role of charge buildup and sputtering in relation to relative dielectric properties of the substrates and close proximity of the samples during irradiation is discussed.
Contido em Journal of micro-nanolithography mems and moems. Bellingham. Vol. 8, no. 1 (Jan. 2009), 013013, 4 p.
Assunto Alumina
Ataque por sputtering
Compostos de silício
Microscopia eletronica de varredura
[en] Heavy ion beam lithography
[en] High-energy ion sputtering
[en] Ion etching
Origem Estrangeiro
Tipo Artigo de periódico
URI http://hdl.handle.net/10183/89720
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