Browsing Engineering by Author "Balen, Tiago Roberto"
Now showing items 1-5 of 5
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Evaluation of single event upset susceptibility of FinFET-based SRAMs with weak resistive defects
(2021) [Journal article]Fin Field-Efect Transistor (FinFET) technology enables the continuous downscaling of Integrated Circuits (ICs), using the Complementary Metal-Oxide Semiconductor (CMOS) technology in accordance with the More Moore domain. ... -
Fault injection on a mixed-signal programmable SoC with design diversity mitigation
(2016) [Journal article]This paper presents an approach for runtime software-based fault injection, applied to a commercial mixed-signal programmable system-on-chip (PSoC). The fault-injection scheme is based on a pseudo-random sequence gen erator ... -
Reliability analysis of 0.5µm CMOS operational amplifiers under TID effects
(2014) [Journal article] -
A self-checking scheme to mitigate single event upset effects in SRAM-based FPAAs
(2009) [Journal article]In this work the problem of Single Event Upset (SEU) is considered in a recent analog technology: The Field Programmable Analog Arrays (FPAAs). Some FPAA models are based on SRAM memory cells to implement the user ... -
Testing a fault tolerant mixed-signal design under TID and heavy ions
(2021) [Journal article]This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing ...
