• A compact model of MOSFET mismatch for circuit design 

      Montoro, Carlos Galup; Schneider, Marcio Cherem; Klimach, Hamilton Duarte; Arnaud, Alfredo (2005) [Artículo de periódico]
      This paper presents a compact model for MOS transistor mismatch. The mismatch model uses the carrier number fluctuation theory to account for the effects of local doping fluctuations along with an accurate and compact dc ...
    • MOSFET mismatch modeling : a new approach 

      Klimach, Hamilton Duarte; Arnaud, Alfredo; Montoro, Carlos Galup; Schneider, Marcio Cherem (2006) [Artículo de periódico]