Navegação Engenharias por Autor "Copetti, Thiago Santos"

Resultados 1-1 de 1

    • Evaluation of single event upset susceptibility of FinFET-based SRAMs with weak resistive defects 

      Copetti, Thiago Santos; Medeiros, Guilherme Cardoso; Taouil, Mottaqiallah; Hamdioui, Said; Poehls, Leticia Maria Bolzani; Balen, Tiago Roberto (2021) [Artigo de periódico]
      Fin Field-Efect Transistor (FinFET) technology enables the continuous downscaling of Integrated Circuits (ICs), using the Complementary Metal-Oxide Semiconductor (CMOS) technology in accordance with the More Moore domain. ...