• Survey on reliability estimation in digital circuits 

      Pontes, Matheus F.; Farias, Clayton; Schvittz, Rafael Budim; Butzen, Paulo Francisco; Rosa Junior, Leomar Soares da (2021) [Artigo de periódico]
      The aggressive technology scaling has signifi-cantly affected the circuit reliability. The interaction of envi-ronmental radiation with the devices in the integrated circuits(ICs) may be the dominant reliability aspect of ...