Now showing items 1-4 of 4

    • Aspectos de robustez para memórias SRAM em FDSOI 

      Marques, Cleiton Magano (2021) [Dissertation]
      A evolução tecnológica permitiu a redução agressiva do tamanho dos transistores, proporcionando melhorias nos aspectos de desempenho e funcionalidade geral da eletrônica. Hoje, a microeletrônica se tornou parte essencial ...
    • Circuit-level design impact on variability and soft errors robustness 

      Brendler, Leonardo Heitich (2020) [Dissertation]
      Physical limitations were found in MOSFET devices with the advancement in microelectronics. To overcome these limitations, multigate devices, such as the FinFET technology, were introduced, allowing the continuity of the ...
    • Radiation robustness of XOR and majority voter circuits at finFET technology under variability 

      Aguiar, Ygor Quadros de (2017) [Dissertation]
      Advances in microelectronics have contributed to the size reduction of the technological node, lowering the threshold voltage and increasing the operating frequency of the systems. Although it has positive outcomes related ...
    • Variability and voltage scaling aware FinFET design 

      Moraes, Leonardo Barlette de (2020) [Dissertation]
      Technology scaling alongside the increasing process variability impact in modern technology nodes are the main reasons to control deviations over metrics in IC nanometer designs. Also, given the increasing set of devices ...