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dc.contributor.authorCarara, Marcos Andrept_BR
dc.contributor.authorBaibich, Mario Norbertopt_BR
dc.contributor.authorSommer, Rubem Luispt_BR
dc.date.accessioned2014-05-31T02:06:40Zpt_BR
dc.date.issued2002pt_BR
dc.identifier.issn0021-8979pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/95819pt_BR
dc.description.abstractIn this work, a study of the stress relief in Finemet ribbons, Fe73.5Cu1Nb3Si16.5B6, as a function of the annealing temperature is presented. The as melt-spun samples are amorphous and become partially crystallized after annealing at appropriate temperatures. For temperatures TA≥480°C the samples are nanocrystalline, with a microstructure composed by α-Fe12xSix(x~0.2) crystallites (10 nm average diameter) embedded in an amorphous matrix. Nanocrystallization, associated with stress relief effects, improves the soft magnetic properties of this kind of material. The stress level was quantified using magnetorestriction (measured by SAMR), magnetoelastic anisotropy, and domain wall energy data obtained from impedance spectra measurements. A reduction of the internal stress from 15 to 0.2 MPa was verified when comparing the as-cast to the sample annealed at 580°C. Improvement of the magnetic softness of the samples was also followed by the increase of the domain wall and magnetization rotation contributions to the overall effective permeability.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofJournal of applied physics. Melville. Vol. 91, no. 10 (May 2002), p. 8441-8443pt_BR
dc.rightsOpen Accessen
dc.subjectMateriais amorfos magnéticospt_BR
dc.subjectTensões internaspt_BR
dc.subjectEfeitos magnetoelasticospt_BR
dc.subjectMateriais nanoestruturadospt_BR
dc.subjectRecozimentopt_BR
dc.subjectLigas de boropt_BR
dc.subjectLigas de cobrept_BR
dc.subjectCristalizaçãopt_BR
dc.subjectImpedância elétricapt_BR
dc.subjectMateriais ferromagnéticospt_BR
dc.subjectLigas de ferropt_BR
dc.subjectParedes de domínios magnéticospt_BR
dc.subjectPermeabilidade magnéticapt_BR
dc.titleStress level in finemet materials studied by impedanciometrypt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000323336pt_BR
dc.type.originEstrangeiropt_BR


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