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    • Probabilistic approach for yield analysis of dynamic logic circuits 

      Brusamarello, Lucas; Silva, Roberto da; Wirth, Gilson Inacio; Reis, Ricardo Augusto da Luz (2008) [Journal article]
      In deep-submicrometer technologies, process variability challenges the design of high yield integrated circuits. While device critical dimensions and threshold voltage shrink, leakage currents drastically increase, threatening ...