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dc.contributor.authorPaesano Junior, Andreapt_BR
dc.contributor.authorTeixeira, Sergio Ribeiropt_BR
dc.contributor.authorAmaral, Liviopt_BR
dc.date.accessioned2014-05-17T02:06:49Zpt_BR
dc.date.issued1991pt_BR
dc.identifier.issn0021-8979pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/95349pt_BR
dc.description.abstractMultilayers of Fee0.33Zr0.67, prepared by electron beam evaporation, have been characterized by conversion electron Mijssbauer spectroscopy, Rutherford backscattering spectroscopy, and x-ray diffraction. Two phases, one amorphous and another crystalline (FeZr3), occur by solid-state reaction. For temperatures of 350 and 500 °C and annealing times ranging from 10 min to 72 h the growth rates of both phases had been obtained. From these results we suggest a model to describe the phase growth kinetics of the amorphouscrystalline Fe0.33Zr0.67 multilayer thin film.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofJournal of Applied Physics. Woodbury. Vol. 70, n. 9 (Nov. 1991), p. 4870-4876pt_BR
dc.rightsOpen Accessen
dc.subjectImplantação de íonspt_BR
dc.subjectEfeito mossbauerpt_BR
dc.subjectRetroespalhamento rutherfordpt_BR
dc.subjectRaios Xpt_BR
dc.subjectFilmes finospt_BR
dc.titleGrowth kinetics of solid-state-reacted fe-zr multilayer filmspt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000055570pt_BR
dc.type.originEstrangeiropt_BR


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